Temperature dependence of electronic behaviors in quantum dimension junctionless thin-film transistor
© Cheng et al.; licensee Springer. 2014
Received: 8 April 2014
Accepted: 9 July 2014
Published: 13 August 2014
The high temperature dependence of junctionless (JL) gate-all-around (GAA) poly-Si thin-film transistors (TFTs) with 2-nm-thick nanosheet channel is compared with that of JL planar TFTs. The variation of SS with temperature for JL GAA TFTs is close to the theoretical value (0.2 mV/dec/K), owing to the oxidation process to form a 2-nm-thick channel. The bandgap of 1.35 eV in JL GAA TFTs by fitting experimental data exhibits the quantum confinement effect, indicating greater suppression of Ioff than that in JL planar TFTs. The measured of −1.34 mV/°C in JL GAA nanosheet TFTs has smaller temperature dependence than that of −5.01 mV/°C in JL planar TFTs.
KeywordsJunctionless Nanowire Thin-film transistor (TFTs) Gate-all-around (GAA) Quantum confinement effect
The junctionless nanowire transistor (JNT), which contains a single doping species at the same level in its source, drain, and channel, has been recently investigated [1–6]. The junctionless (JL) device is basically a gated resistor, in which the advantages of junctionless devices include (1) avoidance of the use of an ultra shallow source/drain junction, which greatly simplifies the process flow; (2) low thermal budgets owing to implant activation anneal after gate stack formation is eliminated, and (3) the current transport is in the bulk of the semiconductor, which reduces the impact of imperfect semiconductor/insulator interfaces. As is widely recognized, the temperature dependence of threshold voltage (Vth) is a parameter when integrated circuits often operate at an elevated temperature owing to heat generation. This effect, accompanied with the degradation of subthreshold swing (SS) with temperature, causes the fatal logic errors, leakage current, and excessive power dissipation. Despite a previous work that characterized JNTs at high temperatures , there is no information regarding the JL thin-film transistor (TFT) at a high temperature yet. Hence, this letter presents a high-temperature operation of JL TFTs with a gate-all-around structure (GAA) for an ultra-thin channel. The JL TFT with a planar structure functions as the control device. The drain current (Id), SS, off-leakage current (Ioff), and Vth are also evaluated for fabricated devices. The JL GAA TFTs with a small variation in temperature performances along with simple fabrication are highly promising for future system-on-panel (SOP) and system-on-chip (SOC) applications.
The process for producing 2-nm-thick poly-Si nanosheet channel was fabricated by initially growing a 400-nm-thick thermal silicon dioxide layer on 6-inch silicon wafers. Subsequently, a 40-nm-thick undoped amorphous silicon (a-Si) layer was deposited by low-pressure chemical vapor deposition (LPCVD) at 550°C. Then, the a-Si layer was solid-phase recrystallized (SPC) and formed large grain sizes as a channel layer at 600°C for 24 h in nitrogen ambient. The channel layer was implanted with 16-keV phosphorous ions at a dose of 1 × 1014 cm−2, followed by furnace annealing at 600°C for 4 h. Subsequently, we performed a wet trimming process with a dilute HF chemical solution at room temperature and shrink down channel thickness to be around 28 nm. The active layers, serving as channel, were defined by e-beam lithography and then mesa-etched by time-controlled wet etching of the buried oxide to release the poly-Si bodies. Subsequently, a 13-nm-thick dry oxide, consuming around 13-nm-thick poly-Si on both side of channel to form 2-nm-thick channel, and 6-nm-thick nitride by LPCVD were deposited as the gate oxide layer. The 250-nm-thick in-situ doped n + poly-silicon was deposited as a gate electrode, and patterned by e-beam and reactive ion etching. Finally, passivation layer and metallization was performed. The JL planar TFT serves as a control with single gate structure.
Results and discussion
where me* is the electron effective mass, h is Plank's constant, Tch is the channel thickness and W is the channel width. The second term in Equation 3, which represents quantum confinement effect in the channel width direction, can be ignored due to W > > Tch. The ΔVth of theoretical value is 0.36 eV, which is larger than experimental value of 0.23 eV. The gap would come from the poly-Si channel material.
where Vfb is the flat-band voltage, Cox is the gate oxide capacitance per unit length, A is the device cross-sectional area and P is the gate perimeter. The first term in the right side of Equation 4 is depended on the flat-band voltage variation with temperature. For ND = 1 × 1019 cm−3, the value of is approach to −0.49 mV/°C as the devices in , which has a P+ polycrystalline silicon gate and the same doping concentration. The second term represents the effect of incomplete ionization. The doped impurities are almost completely ionized at those temperatures higher than room temperature. Thus, the doping concentration variation with the temperature has a slight dependence on temperature. The third term, depending on the electron effective mass, also has a smaller dependence on T than the other terms. The theoretical value of is about −0.49 mV/°C; although the of −1.34 mV/°C in JL GAA TFTs is larger than theoretical value, but is comparable with current SOI-based JNT ( approximately −1.63 mV/°C)  due to the use of the multi-gate structure and formation of a crystal-like nanosheet channel with fewer traps by oxidation process. Therefore, JL TFTs with the GAA structure and ultra-thin channel shows an excellent immunity to the temperature dependence on Vth and competes with SOI-based JNT. Figure 4b presents the measured on-current (Ion) as a function of temperature. The Ion is defined as the drain current at Vg = 3 V for JL planar TFTs and at Vg = 6 V for JL GAA TFTs. The JL GAA TFTs show a slightly better Ion variation with temperature than the planar ones, possibly owing to a smaller in JL GAA TFTs.
This work has presented a high-temperature operation of JL TFTs. The high temperature dependence of JL GAA and planar TFTs is also studied. The variation of parameters such as Vth, Ion, SS, and Ioff are analyzed as well. The variation of the SS with temperature for JL GAA TFTs is close to the ideal value (0.2 mV/dec/K) owing to the ability of the oxidation process to form a nanosheet channel and crystal-like channel. Additionally, Ioff is negligibly small for JL GAA TFTs, owing to quantum confinement effect; its Eg of 1.35 eV is also extracted. The JL GAA TFTs have a smaller than that of JL planar TFTs owing to the GAA structure and ultra-thin channel. Moreover, the measured of JL GAA TFTs competes with that of SOI-based JNTs. Therefore, the JL GAA TFTs with a slight variation in temperature performances along with simple fabrication are highly promising for future SOP and system-on-chip SOC applications.
The authors would like to acknowledge the National Science Council of Taiwan for supporting this research under Contract No. MOST 103-2221-E-007 -114 -MY3. The National Nano Device Laboratories is greatly appreciated for its technical support.
- Lee CW, Afzalian A, Akhavan ND, Yan R, Ferain I, Colinge JP: Junctionless multigate field-effect transistor. Appl Phys Lett 2009, 94: 053511. 10.1063/1.3079411View ArticleGoogle Scholar
- Colinge JP, Lee CW, Afzalian A, Akhavan ND, Yan R, Ferain I, Razavi P, O’Neil B, Blake A, White M, Kelleher AM, McCarthy B, Murphy R: Nanowire transistors without junctions. Nat Nanotechnol 2010, 5: 225. 10.1038/nnano.2010.15View ArticleGoogle Scholar
- Colinge JP, Lee CW, Ferain I, Akhavan ND, Yan R, Razavi P, Yu R, Nazarov AN, Doria RT: Reduced electric field in junctionless transistors. Appl Phys Lett 2010, 96: 073510. 10.1063/1.3299014View ArticleGoogle Scholar
- Lin HD, Lin CI, Huang TY: Characteristics of n-Type Junctionless Poly-Si Thin-Film Transistors With an Ultrathin Channel. IEEE Electron Device Lett 2012, 33: 53.View ArticleGoogle Scholar
- Su CJ, Tsai TI, Liou YL, Lin ZM, Lin HC, Chao TS: Gate-all-around junctionless transistors with heavily doped polysilicon nanowire channels. IEEE Electron Device Lett 2011, 32: 521.View ArticleGoogle Scholar
- Rios R, Cappellani A, Armstrong M, Budrevich A, Gomez H, Pai R, Rahhal-orabi N, Kuhn K: Comparison of Junctionless and conventional trigate transistors with Lg down to 26 nm. IEEE Electron Device Lett 2011, 32: 1170.View ArticleGoogle Scholar
- Lee CW, Borne A, Ferain I, Afzalian A, Yan R, Akhavan ND, Razavi P, Colinge JP: High-temperature performance of silicon junctionless MOSFETs. IEEE Electron Device 2010, 57: 620.View ArticleGoogle Scholar
- Dimitriadis CA: Gate bias instability in hydrogenated polycrystalline silicon thin film transistors. J Appl Phys 2000, 88: 3624. 10.1063/1.1289525View ArticleGoogle Scholar
- Guo X, Ishii T, Silva SRP: Improving switching performance of thin-film transistors in disordered silicon. IEEE Electron Device Lett 2008, 29: 588.View ArticleGoogle Scholar
- Sze SM, Ng K: Physics of Semiconductor Devices. 3rd edition. New York: Wiley; 2007.Google Scholar
- Synopsys, Inc: Sentaurus Device User Guide. Mountain View: Version I-2013.12; 2013.Google Scholar
- Ancona MG, Iafrate GJ: Quantum correction to the equation of state of an electron gas in a semiconductor. Phys Rev B 1989, 39: 9536. 10.1103/PhysRevB.39.9536View ArticleGoogle Scholar
- Trevisoli RD, Doria RT, de Souza M, Pavanello MA: Threshold voltage in junctionless nanowire transistors. Semiconductor Sci Technol 2011, 26: 1.View ArticleGoogle Scholar
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