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Table 1 Fitting parameters obtained from the experimental data of Fig. 3a using a three exponential decay model

From: Surface-Related States in Oxidized Silicon Nanocrystals Enhance Carrier Relaxation and Inhibit Auger Recombination

Pump (eV) 4.13 Probe (eV)
2.75 2.25 1.95 1.65 1.26
α1 0.46 0.31 0.65 0.65 0.75
τ1(ps) 5.1 1.0 0.79 0.59 0.86
α2 0.36 0.49 0.35 0.35 0.25
τ2(ps) 15.7 5.8 4.4 3.2 3.4
α3 0.18 0.17
τ3(ps) 982 127