Figure 2From: Nanocolumnar Preferentially Oriented PSZT Thin Films Deposited on Thermally Grown Silicon DioxideAtomic force microscopy scan results for PSZT thin film deposited at 700 °C:a three-dimensional representation of film surface showing facetted tightly packed grains,b topography image obtained over an area of 1 × 1 μm2, andc the deflection image corresponding to the topography in (b)Back to article page