Figure 2From: The Effect of Interface Texture on Exchange Biasing in Ni80Fe20/Ir20Mn80SystemThe X-TEM images of glass/Ta(30 Å)/NiFe(50 Å)/IrMn(90 Å)/Ta(100 Å) samples under three different deposition conditions:a deposited at RT only,b deposited at RT with an external fieldh = 500 Oe, andc the same film-growth procedure as in (b), post-annealing atT A = 250 °C withh on for 1 h, and then field-cooling to RTBack to article page