Figure 3From: Atomic Force Microscopy Study of the Kinetic Roughening in Nanostructured Gold Films on SiO2 Representative surface roughness power spectra for the analyzed sample calculated by the AFM images reported in Fig. 1:a for the sample with a thickness of 2 nmb of 8 nm,c of 14 nm,d of 20 nm,e of 26 nm,f of 32 nm of Au respectively. The continuous lines represent the fit by Eq. 4. The values ofγ i reported as insets are calculated by such fitsBack to article page