Figure 5From: Structural Analysis of Highly Relaxed GaSb Grown on GaAs Substrates with Periodic Interfacial Array of 90° Misfit DislocationsPlan-view TEMs showing moiré fringes of 2D IMF arrays alonga[110]b[1-10], andc 2D Lomer dislocation network along both [110] and [1-10] measured using diffraction vectors (220), (2-20), and both (220) and (2-20), respectively. Consecutivewhite anddark lines represent moiré fringes, and thewhite circles represent the edge dislocationsBack to article page