Figure 1From: Residual Stress Relaxation Induced by Mass Transport Through Interface of the Pd/SrTiO3XPS in depth analysis of 30-nm (a) and 50-nm (b) Pd thin films deposited on SrTiO3 perovskite substrate. a and b represent near-interface and interface terms which their ratio reveals simply the percentage of diffused oxygen atoms from substrate through Pd film. c and d represent the in-depth variation of the oxygen 1S spectra for 30- and 50-nm Pd thin filmBack to article page