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Figure 1 | Nanoscale Research Letters

Figure 1

From: Creation of Controlled Defects Inside Colloidal Crystal Arrays with a Focused Ion Beam

Figure 1

Left: Attempts to achieve a single-sphere removal using different strategies with a standard FIB milling (i.e., without water vapor injection for CE milling). The recipes for M1,M2, M3 and M4 are reported in the text. Right S1: Another attempt to achieve a single-sphere removal without SCM; S2: a successful attempt which employs the SCM option. In the inset, S3: a further improvement of the recipe in S2 that achieves the sphere removal in 50 s (Both ion images with a Horizontal-Field Width [HFW] of 8.53 μm; inset: ion image, bar 500 nm)

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