Figure 4From: The Characteristics of Seebeck Coefficient in Silicon Nanowires Manufactured by CMOS Compatible ProcessThe measured output voltage as a function of temperature difference between cold and hot region. The cold region temperature (T C) is set as 20°C, and the hot region temperature (T H) is controlled from 20 to 42°C. The output voltage characteristics are measured in various nanowire widths of 30, 40, 100 and 150 nmBack to article page