Figure 2From: Excitation Intensity Driven PL Shifts of SiGe Islands on Patterned and Planar Si(001) Substrates: Evidence for Ge-rich Dots in IslandsPL spectra for 16 mW/cm2 <P exc < 244.3 W/cm2 measured for islands on a pit-patterned substrate. Only a minor shift of the island PL with increasing P exc is observed. A new peak of unknown origin appears for P exc ≥ 18 W/cm2 at 898 meV. The detector cut-off at 0.77 eV is indicated by the dashed line. The spectra are shifted vertically for clarityBack to article page