Skip to main content

Advertisement

Table 1 Measured data shown as portion of leakage current levels (ILEAK/ION) in percentages (%) at different temperatures

From: High-Temperature Stable Operation of Nanoribbon Field-Effect Transistors

Temperature (oC) Method 1 (%) Method 2 (%)
25 0.28 5.2 × 10−6
50 0.72 2.5 × 10−6
75 1.9 2.8 × 10−5
100 3.8 3.2 × 10−3
125 5.8 9.8 × 10−3
150 9.8 0.90