Table 1 Measured data shown as portion of leakage current levels (ILEAK/ION) in percentages (%) at different temperatures
From: High-Temperature Stable Operation of Nanoribbon Field-Effect Transistors
Temperature (oC) | Method 1 (%) | Method 2 (%) |
|---|---|---|
25 | 0.28 | 5.2 × 10−6 |
50 | 0.72 | 2.5 × 10−6 |
75 | 1.9 | 2.8 × 10−5 |
100 | 3.8 | 3.2 × 10−3 |
125 | 5.8 | 9.8 × 10−3 |
150 | 9.8 | 0.90 |