Figure 4From: Characterization of Films with Thickness Less than 10 nm by Sensitivity-Enhanced Atomic Force Acoustic MicroscopyThe spectra for reference samples [Si (100), Si (111), Al 2 O 3 (0001), and diamond (100)] and hard disk samples [6 nm-DLC (Sputter), 10 nm-DLC (CVD) and Co-Cr alloy (hard disk without DLC)].Back to article page