Figure 3
From: Dielectric Relaxation of La-Doped Zirconia Caused by Annealing Ambient
C–V measurements were carried out at frequency = 1 kHz for as-deposited and PDA samples.
Figure 3 | Nanoscale Res Lett
From: Dielectric Relaxation of La-Doped Zirconia Caused by Annealing Ambient
C–V measurements were carried out at frequency = 1 kHz for as-deposited and PDA samples.