Figure 6From: Dielectric Relaxation of La-Doped Zirconia Caused by Annealing AmbientFrequency dependence of k-value of La 0.35 Zr 0.65 O 2 dielectric for as-deposited and PDA samples. Significant dielectric relaxation was observed in the air-annealed sample. Solid lines are the fitting results using equations (1) and (2).Back to article page