Figure 2From: Multidimensional characterization, Landau levels and Density of States in epitaxial graphene grown on SiC substrates AFM images of continuous and almost free standing monolayer graphene islands grown on the C-face of an 8° off-axis 4H-SiC substrate. (a) at a large scale, the zoom in (b) showing the wrinkle and the step bunched character of the SiC surface below and (c) a layer scratched by an AFM tip.Back to article page