Figure 2
From: Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography
HRTEM image of SiO 2 /SRSO layers in cross-sectional view. White circles highlight two Si-ncs.
Figure 2 | Nanoscale Research Letters
From: Atomic characterization of Si nanoclusters embedded in SiO2 by atom probe tomography
HRTEM image of SiO 2 /SRSO layers in cross-sectional view. White circles highlight two Si-ncs.