Table 2 Relative concentrations of O, Zr and Si (%) at the surface of the SZ-SiO2 materials as determined by XPS
2 | 3 | 4 | 5 | 6 | 7 | 8 | 9 | |
---|---|---|---|---|---|---|---|---|
O1s | 68.26 | 69.63 | 75.91 | 72.08 | 78.33 | 69.49 | 84.03 | 74.58 |
Zr3p 3/2 | 0.22 | 0.24 | 0.21 | 1.20 | 1.02 | 1.28 | 5.69 | 9.00 |
Si2s | 31.53 | 30.14 | 31.53 | 26.72 | 20.65 | 29.23 | 10.28 | 16.43 |