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Table 2 Relative concentrations of O, Zr and Si (%) at the surface of the SZ-SiO2 materials as determined by XPS

From: Ionic liquid-templated preparation of mesoporous silica embedded with nanocrystalline sulfated zirconia

 

2

3

4

5

6

7

8

9

O1s

68.26

69.63

75.91

72.08

78.33

69.49

84.03

74.58

Zr3p 3/2

0.22

0.24

0.21

1.20

1.02

1.28

5.69

9.00

Si2s

31.53

30.14

31.53

26.72

20.65

29.23

10.28

16.43

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