Figure 5From: Micro-spectroscopy on silicon wafers and solar cells Hole density and lifetime values in the BSF. The Raman-Fano-measured hole density in the BSF (p+-layer) (a) and the resulting effective Shockley-Read-Hall lifetime at high injection (b). Lifetime values greater than 200 ns mean that the lifetime is solely limited by Auger recombination.Back to article page