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Figure 9 | Nanoscale Research Letters

Figure 9

From: Micro-spectroscopy on silicon wafers and solar cells

Figure 9

Hole density contrast and stress around a nickel precipitate. The green lines mark the directions of high compressive (negative) stress, which tend to show a lower hole density contrast (recombination activity). In areas of high tensile (positive) stress, the hole density contrast is increased (higher recombination activity).

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