Figure 2From: Nanoscale structural characterization of epitaxial graphene grown on off-axis 4H-SiC (0001) AFM morphology and phase of SiC samples annealed at different temperatures. Surface morphology for the samples annealed at 1600 (a), 1700 (b) and 2000°C (c), and corresponding phase maps on the same samples ((d), (e) and (f)).Back to article page