Figure 3
From: Combining scanning probe microscopy and x-ray spectroscopy
Twin topography-luminescence images. Top: (a-d) topography of a ZnO-ZnWO4 sputtered layer (2 × 2 μm2). Bottom: corresponding visible light emission cartography under illumination by X-ray beam from left to right below (e) and above (f) the Zn-Kα threshold (9.6 keV) and below (g) and above (h) the W-L 3 threshold (10.2 keV). On top of the images is indicated the X-ray primary energy.