Figure 1From: Optical identification of electronic state levels of an asymmetric InAs/InGaAs/GaAs dot-in-well structure Photoluminescence spectrum measured at 15 K (a) and statistic histogram of aspect ratio (1 μm × 1 μm) (b) of the as-grown sample. Dashed lines in (a) present the Gaussian fitting of PL peak. Inset of (a) gives sketch of sample structure and inset of (b) gives 1 μm × 1 μm AFM image.Back to article page