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Figure 1 | Nanoscale Research Letters

Figure 1

From: Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy

Figure 1

(a1, a2) AFM topographic images (1 × 1 μm 2 ) of a 'raw' CNT obtained with a Pt/Ir and a diamond tip, respectively; (b1, b2) CNT height profile along dotted lines; (c1, c2) corresponding electrical maps; (d1, d2) distribution histograms of resistance values measured in the region marked out by a rectangle on the CNT. The cantilever load-force was about 16 to 80 nN, respectively, for k = 1 to 5 N/m. V tip-sample = +1 V.

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