Figure 2From: Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy (a1, a2) AFM topographic images (1 × 1 μm 2 ) of a CNT functionalized with AuNPs, obtained with a Pt/Ir and a diamond tip, respectively; (b1, b2) CNT height profile along dotted lines; (c1, c2) corresponding electrical maps; (d1, d2) distribution histograms of resistance values measured in the region marked out by a rectangle on the CNT. Same experimental parameters as for Figure 1.Back to article page