Figure 3From: Evaluation of the nanotube intrinsic resistance across the tip-carbon nanotube-metal substrate junction by Atomic Force Microscopy (a) Schematic view of the AFM tip and the «tip-CNT-substrate» junction. A bias voltage V is applied between the tip and the substrate, the arrows represent the direction of the current lines. (b) Series-parallel resistance network corresponding to setup scheme.Back to article page