Figure 1From: Reliable processing of graphene using metal etchmasks Characterisation of as transferred graphene on SiO 2 substrates. On left XPS spectrum shows good quality graphene, on right AFM image shows presence of large flakes of graphene with some contamination (marked by circles) and cracks (marked by rectangles). The Raman spectrum of monolayer graphene obtained from the sample is shown in inset.Back to article page