Figure 4From: Influence of surface properties on the electrical conductivity of silicon nanomembranes Si 2p XPS core level peaks for Si and SiO 2 . As a function of exposure time in air: red solid lines, blue dashed lines, and black dotted line correspond to samples treated by VH, HF, and with native-oxide surface, respectively. Take-off angle is 15°, pass energy is 35.75 eV. The top curve has been shifted by approximately 0.4 eV to facilitate comparison with the other curves. This shift is presumably due to surface charging.Back to article page