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Figure 4 | Nanoscale Research Letters

Figure 4

From: Influence of surface properties on the electrical conductivity of silicon nanomembranes

Figure 4

Si 2p XPS core level peaks for Si and SiO 2 . As a function of exposure time in air: red solid lines, blue dashed lines, and black dotted line correspond to samples treated by VH, HF, and with native-oxide surface, respectively. Take-off angle is 15°, pass energy is 35.75 eV. The top curve has been shifted by approximately 0.4 eV to facilitate comparison with the other curves. This shift is presumably due to surface charging.

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