Figure 1
From: Formation of silicon nanodots via ion beam sputtering of ultrathin gold thin film coatings on Si
Spatial profile of the half-coated sample before and after irradiation. (a) Spatial profile of the XPS core level spectra of Au-4f and Si-2p before Ar+ 200 eV irradiation and (b) after irradiation. Position is plotted vertically along the sample where one region has a 20-nm Au film (top of Figure 1) and the bottom region only Si. (c-d) SEM images corresponding to the postirradiation condition for the Au-coated (c) and uncoated (d) regions. Si nanostructures are evidenced only in the region where Au was deposited noting that in (b) XPS Au-4f spectra are absent.