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Figure 4 | Nanoscale Research Letters

Figure 4

From: Porous anodic alumina on galvanically grown PtSi layer for application in template-assisted Si nanowire growth

Figure 4

Plane-view bright-field image (a) and the corresponding electron diffraction pattern (b) from sample S-30 min. Si and PtSi rings are revealed, while no Pt rings are detected. The nanofeatures on the plane-view image seem to be holes corresponding to the footprint of nanocrystals that were probably removed during sample preparation. Their diameter is larger than the PtSi nanoparticles observed in sample S-15 min.

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