Figure 1From: High-precision, large-domain three-dimensional manipulation of nano-materials for fabrication nanodevices SEM image, TEM image and the corresponding ED pattern, and EDS spectra of nanowires. (a) SEM image of as-grown tapered ZnS nanowires. (b) TEM image showing a tapered ZnS nanowire tipped by a Sn particle on its thicker end. The lower-left inset showing the corresponding ED pattern recorded with an incident electron beam along the [100] direction. (c) EDS spectra recorded for a nanowire (curve i) and a spherical Sn particle on its end (curve ii).Back to article page