Figure 4From: High-precision, large-domain three-dimensional manipulation of nano-materials for fabrication nanodevices TEM images and plot of the angle between ZnS nanowire probe and a marked nanowire. (a) Consecutive TEM images shows continuously the bending of the ZnS nanowire probe, continuously increasing DC bias voltage from V = 0 V to V = 55 V. (b) A plot of the angle between the ZnS nanowire probe and the marked nanowire and applied voltage over time.Back to article page