Figure 5
From: Growth mechanism and magnon excitation in NiO nanowalls
EDS mapping of NiO. (a) Side view of a cross-sectional NiO grid SEM image, indicating the existence of the Ni core and NiO surface at T A = 700°C, (b) Typical EDS pattern taken at the Ni core, and (c) NiO surface. (d, e) Two-dimensional EDS mapping images of the distribution of elements presented using the lock-in energy of Ni-Kα1 (7.3 to 7.6 keV) and O-Kα1 (0.4 to 0.6 keV). The inset to (e) shows a step function at both edges that can be used to define the mean diffusion length <S >.