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Figure 8 | Nanoscale Research Letters

Figure 8

From: Direct synthesis and characterization of optically transparent conformal zinc oxide nanocrystalline thin films by rapid thermal plasma CVD

Figure 8

SEM of ZnO films annealed in pure argon at temperatures from 750°C to 950°C. Annealed samples from films of initially identical morphology and average grain sizes show an increasing restructuring of film texture with higher annealing temperatures. (a) As-deposited ZnO film and ZnO films annealed at (b) 750°C, (c) 800°C, (d) 850°C, (e) 900°C, and (f) 950°C. Scale bar = 100 nm.

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