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Table 1 Atomic concentrations

From: Annealing of gold nanostructures sputtered on polytetrafluoroethylene

AU layer thickness Temperature Atomic concentrations of elements in at.%
   C C PTFE O Au F F/C PTF
20 nm RT 43.5 4.4 6.5 41.6 8.5 1.93
  300°C 37.8 34.8 0.4 3.4 58.4 1.68
80 nm RT 41.0 3.1 4.4 48.6 6.0 1.94
  300°C 36.8 27.2 1.2 14.8 47.2 1.74
  1. Atomic concentrations (in atomic percent) of C (1s), O (1s), Au (4f), and F(1s) in Au-sputtered PTFE samples with Au effective thickness 20 and 80 nm after deposition (RT) a after annealing (300°C) measured by XPS. CPTFE, calculated concentration from XPS data of carbon (in atomic percent) originating from PTFE only; F/CPTFE, stands for fluorine to PTFE carbon ratio.