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Table 1 The lattice constant determined by XRD

From: Investigation of cracks in GaN films grown by combined hydride and metal organic vapor-phase epitaxial method

  Degree Lattice constant c(nm) ε zz E 2(high) (cm-1) Radius of curvature (m)
  (0002) (0004)     
A 34.6848 73.0178 0.51870 0.000386 568.735 0.98
Af5 34.6851 73.0176 0.51869 0.000366 568.711 0.98
A10f 34.6844 73.0174 0.51858 0.000154 568.504 1.02
  1. The Raman shift at the near surface.