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Table 1 The lattice constant determined by XRD

From: Investigation of cracks in GaN films grown by combined hydride and metal organic vapor-phase epitaxial method

 

Degree

Lattice constant c(nm)

ε zz

E 2(high) (cm-1)

Radius of curvature (m)

 

(0002)

(0004)

    

A

34.6848

73.0178

0.51870

0.000386

568.735

0.98

Af5

34.6851

73.0176

0.51869

0.000366

568.711

0.98

A10f

34.6844

73.0174

0.51858

0.000154

568.504

1.02

  1. The Raman shift at the near surface.

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