Skip to main content
Figure 2 | Nanoscale Research Letters

Figure 2

From: Ultra-steep side facets in multi-faceted SiGe/Si(001) Stranski-Krastanow islands

Figure 2

Surface angle images, laplacian images and surface orientation maps for two selected cupola islands. Surface angle images (a, d) and respective Laplacian images (b, e) with pure edge contrast of two cupola-shaped SiGe islands obtained by AFM. The calculated surface orientation maps of the two islands are shown in panels (c) and (f), in which the bright spots labeled by the different symbols indicate all facets of the islands. The large bold symbols mark the five new facets groups and the {111} facets, the other facets also observed for barn or dome-shaped islands are marked by the small white symbols as listed below panels (c) and (f). For reasons of visibility not all the facets are marked with symbols in both images. The dotted, dashed and solid circles in the SOMs mark all surfaces inclined by θ = 25.3°, respectively, 54.7° and 68° to the (001) substrate plane indicate the locations of the {113}, {111} and {12 3 5} facet spots, respectively, where the latter are the steepest side facets of the islands. The averaged tilt and azimuth angles θ and φ of all facets are listed in Table 1.

Back to article page