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Figure 8 | Nanoscale Research Letters

Figure 8

From: Fabrication, characterization, and kinetic study of vertical single-crystalline CuO nanowires on Si substrates

Figure 8

I - V characteristics and the average electrical resistance of the CuO nanowire sample. (a) I-V characteristics of the CuO nanowire sample measured at different environmental temperatures. The inset shows a schematic illustration of CuO nanowire device configuration. (b) The average electrical resistance of the CuO nanowire sample as a function of environmental temperature.

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