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Table 1 Variation of Seebeck coefficient for different roughness amplitudes

From: Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films

A0 (nm)

S(μV/K)

Smooth

470

0.1

475

0.3

537

0.5

740

  1. Roughness wavelength (λ) = 2.5 nm is fixed.

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