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Table 1 Variation of Seebeck coefficient for different roughness amplitudes

From: Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films

A0 (nm) S(μV/K)
Smooth 470
0.1 475
0.3 537
0.5 740
  1. Roughness wavelength (λ) = 2.5 nm is fixed.