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Table 2 Variation of Seebeck coefficient for different roughness wavelengths

From: Tailoring of Seebeck coefficient with surface roughness effects in silicon sub-50-nm films

λ (nm)

S(μV/K)

Smooth

470

5.0

545

3.3

646

2.5

740

  1. Roughness amplitude (A0) = 0.5 nm is fixed

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