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Figure 9 | Nanoscale Research Letters

Figure 9

From: Reliability characteristics and conduction mechanisms in resistive switching memory devices using ZnO thin films

Figure 9

Temperature-dependent J-E characteristics and electrical conductivity in LRS. (a) Linear relation between current density and electric field at temperature ranging from 25 to 150°C in LRS. (b) Temperature dependence (diamond with black and white shades) of the electrical conductivity in LRS. The inset graph shows the location of Fermi level in ohmic conduction. σ, Electrical conductivity; EC, conduction band edge; T, absolute temperature; K1, Boltzmann's constant; Ea, activation energy; EV, valence band edge.

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