Figure 4From: Tailoring of polar and nonpolar ZnO planes on MgO (001) substrates through molecular beam epitaxyAFM results. (a) AFM image of the ZnO film surface grown at 150°C. (b) AFM image of the ZnO film surface grown at 420°C. (c) The evolution of surface roughness as a function of substrate temperature. (d) The evolution of XRD FWHM values as a function of substrate temperature.Back to article page