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Figure 4 | Nanoscale Research Letters

Figure 4

From: Delayed crystallization of ultrathin Gd2O3 layers on Si(111) observed by in situ X-ray diffraction

Figure 4

Comparison between measured and simulated CTRs. One-dimensional intensity profiles along the CTR (10L)hex as measured (black curves) and calculated (red). The given values refer to nominally deposited layer thickness. In the beginning, the experimental profile does not change (gray), followed by a crystallization process (dark gray) which finally ends up with crystalline growth (yellow).

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