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Figure 1 | Nanoscale Research Letters

Figure 1

From: The use of artificial neural networks in electrostatic force microscopy

Figure 1

Two metallic objects with different applied voltages and electrostatic force microscope tip and sample. (a) Schematic representation of a system of two metallic objects with different applied voltages V1 and V2. Its equivalent ANN is also shown as an inset. (b) Scheme of an electrostatic force microscope tip and sample. The tip surface has been divided in three regions with a finite number of points (N1, N2, and N3). The tip and sample are characterized by eight parameters: the tip sample distance D, the tip apex radius R, the tip length L, the cone half-angle θ, the radius R2, the thin film thickness h1, the thin film dielectric constant ϵ1, and the sample dielectric constant ϵ2.

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