Figure 1

Two metallic objects with different applied voltages and electrostatic force microscope tip and sample. (a) Schematic representation of a system of two metallic objects with different applied voltages V₁ and V₂. Its equivalent ANN is also shown as an inset. (b) Scheme of an electrostatic force microscope tip and sample. The tip surface has been divided in three regions with a finite number of points (N₁, N₂, and N₃). The tip and sample are characterized by eight parameters: the tip sample distance D, the tip apex radius R, the tip length L, the cone half-angle θ, the radius R₂, the thin film thickness h₁, the thin film dielectric constant ϵ₁, and the sample dielectric constant ϵ₂.