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Figure 2 | Nanoscale Research Letters

Figure 2

From: The use of artificial neural networks in electrostatic force microscopy

Figure 2

Potential distribution around an EFM tip. 3D representation of the potential distribution around an EFM tip (L = 10 R, θ = 20°) over a dielectric sample (D = 0.1 R, ϵ = 10) as a function of the ANN iterations in the learning process Nit. 2D equipotential distribution in the middle of the image corresponds to the results obtained by the standard LSM.

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