Figure 6From: Fabrication and characterization of WO3/Ag/WO3 multilayer transparent anode with solution-processed WO3 for polymer light-emitting diodesComparison of morphologies of WAW multilayer and ITO. AFM image and surface roughness (root mean square and peak-to-valley) of solution-processed WAW multilayer and conventional ITO. Rrms, rms surface roughness; Rpv, peak-to-valley roughness.Back to article page