Figure 6

I-V curves of ZnO-PS structure (ZHP sample) in a sandwich configuration, measured at room temperature. The voltage varies from −4 to 4 V with a sweep rate of 150 mV/s. The inset in the lower part shows the schematic of the configuration used for I-V characteristics. The inset of Figure 5c shows CL emission spectra as a function of time showing the degradation of the as-etched PS layer by high-energy electrons.