Figure 3From: Investigations into the impact of various substrates and ZnO ultra thin seed layers prepared by atomic layer deposition on growth of ZnO nanowire arraySEM images of the NWs grown on ZnO seed layers with different thickness. (a) 2 nm, (b) 4 nm, (c) 6 nm, (d) 8 nm, (e) 10 nm, (f) 20 nm, (g) 50 nm and AFM images of ZnO seed layers with different thickness (h) 2 nm, (i) 4 nm, (j) 6 nm, (k) 8 nm, (l) 10 nm, (m) 20 nm, and (n) 50 nm. The lateral scan dimensions are 2 μm × 2 μmm, and the Z value denotes the full vertical length scale.Back to article page