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Table 1 Description of the dwell time, etching time, and spacing

From: High performance surface-enhanced Raman scattering substrates of Si-based Au film developed by focused ion beam nanofabrication

Based FIB Si

FIB machining parameters

Dwell time (μs)

Etching time (min)

Spacing (nm)

A_1

30 kV voltage and 10 pa accelerate current

1

8

15 ± 1

A_2

 

1

11

18 ± 1

A_3

 

5

8

22 ± 2

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