Figure 12
From: Highly conductive vertically aligned molybdenum nanowalls and their field emission property
SEM images and corresponding I - V characteristics and schematic circuit diagram. (a) SEM image showing the W microprobe in contact with the top end of three single nanowalls for electrical conductivity measurements. (b) The corresponding I-V characteristic curve in (a). (c) SEM image showing the W microprobe in contact with the mid-layer for electrical conductivity measurements. (d) The corresponding I-V characteristic curve in (c). (e) The corresponding schematic circuit diagram.