Figure 4From: Structural variations of Si1−xC x and their light absorption controllabilityRaman spectra and volume fractions. Raman spectra of (a) SL and (b) SRSC for as-deposited and annealed samples at 800°C, 900°C, and 1,000°C. (c) nc-Si volume fractions of each samples extracted from the Raman spectra.Back to article page